Scalability
UbroSoft has access to a wide network of dedicated test centres spread across the India. We have successfully conducted single session exams for 1.8 lakh candidates in more than 200 cities across India.
Efficient
The turnaround time for delivering an assessment is significantly reduced to approximately three to four weeks as against nine months, required for a paper-pencil exam today.
Selecting convenient exam centre
UbroSoft owns and runs a LARGE NETWORK of Test Centers with required facilities and Infrastructure. UbroSoft also performs an audit of test centres to estimate the actual infrastructure capacity (number of computers and so on).
Prevent question paper leakage
Provides a secure method to create, review, and seal question papers. Question papers are distributed on the day of the exam via multiple modes.
Track pre and post assessment activities
The solution verifies the test centre infrastructure before the assessment commences. Helps conducts a highly secure, scalable, and real-time monitored exam. Exam activities can be tracked at the national, zonal, regional, city, test centre, or LAN level.
Service Support
A Help Desk is available daily to clarify and answers candidate queries. Data entry and scanning facilities are available to support and facilitate the assessment process.
Recent Works & Projects
Uttar Pradesh Power Corporation Limited
Ubrosoft has conduct UPPCL examination 2017 successfully with zero defect
Uttar Pradesh Police Recruitment And Promotion Board
Ubrosoft has conduct UPPRPB examination 2017 successfully with zero defect
University of Delhi
Ubrosoft has conduct University of Delhi entrance examination 2017 successfully with zero defect
Insurance Institute of India
Ubrosoft has conduct III Pramotional examination 2017 successfully with zero defect
Staff Selection Commission
Ubrosoft has conduct SSC-CHSL,SSC-CGL,SSC-MTS,SSC-IMD,SSC-JE,etc. successfully with zero defect.
AKTU Entrance Examination 2017
Ubrosoft has conduct AKTU online entrance examination 2017 successfully with zero defect.